TSMC rolls out 65nm reference flow

July 17, 2006 – Taiwan Semiconductor Manufacturing Co. (TSMC) has introduced Reference Flow 7.0, offering statistical static timing analyzer, power management techniques, and various DFM enhancements.

TSMC says its design methodology is the first to include statistical timing analysis capabilities, through integration of tools from EDA vendors Cadence Design Systems, Synopsys, and now Magma Design Automation, that analyzes timing effects of manufacturing process variations, to optimize design margins and die yields. Capabilities include statistical SPICE models, library and IP characterization, standard cell design kits, EDA tool enhancements and corresponding design methodologies.

The reference flow also incorporates leakage power reduction technology, including an enhanced voltage island implementation and multi-corner timing closure. A coarse-grained power gating technique helps achieve leakage reductions of up to two orders of magnitude. New power management libraries are also included.

In addition, the flow includes critical area analysis to identify potential random manufacturing defects and drive wire spreading and wire widening corrective actions, as well as virtual chemical mechanical polishing (VCMP) analysis to identify metal and dielectric thickness variation hot spots, and guide dummy metal insertion to improve thickness uniformity throughout the chip. TSMC also has qualified several lithography process check (LPC) post-production tools as DFM compliant.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>


Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...
Radiant Vision Systems announces new automated visual inspection system
11/06/2017Radiant Vision Systems, a provider of high-resolution imaging solutions for automated visual analysis of devices and surfaces, an...
SEMI-GAS Xturion Blixer enables on-site blending of forming gas mixtures
10/03/2017The Blixer provides a cost-effective alternative to purchasing expensive pre-mixed gas cylinders by enabling operators to blend ...