Fraunhofer-led EU solar R&D adds Synova as partner

Feb. 26, 2008 – Synova says it has joined a research alliance led by the Fraunhofer Institute for Solar Energy Systems to explore how its water jet-guided laser technology could be used as a manufacturing method to speed processing and improve performance of solar cells.

The technology could be a “superior” alternative to conventional lasers, chemical processes, diamond blade saws, and multiwire slurry saws, the company notes, because the wet approach eliminates heat and silicon surface damage, as well as debris contamination improving cell integrity and ultimately better cell efficiency and lower costs. The researchers are looking to combine the technology with chemicals to address a host of PV wafering and microstructuring techniques, including grooving, cutting, slicing, doping, etching, isolation and via drilling.

“We’re excited by the prospect of exploring new opportunities to extend Laser MicroJet’s capability beyond the progress it has already brought to solar-cell production,” said Synova CEO Bernold Richerzhagen, in a statement.

The research alliance is partly a continuation of a July 2007 study on solar-cell edge isolation, following initial collaborative work in 2002. Another LMJ machine is slated to be shipped next month (March); research is expected to continue through 1Q09.

Last year Synova also made other PV inroads through a development deal with Manz Automation, creating a hybrid tool with an inline laser edge isolation system for photovoltaic manufacturing of mono- and multi-crystalline solar cells. Orders for the tool will be taken starting in June of this year.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>



Edwards launches new Smart Thermal Management System at SEMICON Europa 2016
10/25/2016Smart TMS helps semiconductor, flat panel display and solar manufacturers improve their process performance and safety by red...
Tektronix introduces Keithley S540 power semiconductor test system
10/19/2016Tektronix, Inc., a worldwide provider of measurement solutions, today introduced the Keithley S540 Power Semiconductor Test System, a ...
Novel Wafer Analyzer for up to 300mm wafer using high speed Raman Imaging Technology
08/08/2016Nanophoton introduces RAMANdrive - a new Wafer Analyzer - for a wide range of applications at semiconductor market a...