Inspect-X 1.5 software from Metris was developed to streamline system operations in computed tomography (CT) applications and X-ray electronics inspection. The software offers an integrated setup wizard for optimized CT data acquisition, thereby reportedly reducing reconstruction time for a 3D volume model. In addition, software enhancements for electronics inspection facilitate operation and automation, which further improve inspection accuracy and repeatability.
For electronic components and PCBs, the software incorporates automated inspection functions that increase consistency and eliminate programming skills. Multiple boards can be loaded and inspected using a single program. The software automatically locates each sample and aligns it with the reference fiducials. Sample-to-sample repeatability is said to be increased due to flux calibration, which normalizes image brightness to a uniform level in areas surrounding the zone of interest. Defects such as ball grid array (BGA) voids or wiring defects can be traced efficiently, using automated sample sentencing with manual override of pass/fail. The compliancy of inspection reports with MRP systems increases manufacturing process integration. Metris Leuven, Belgium www.metris.com