Nanolab Technologies Adds X-Ray Capabilities

July 1, 2009 — Xradia, Inc., a developer and manufacturer of high-resolution 3D X-ray imaging systems, announced a partnership with NanoLab Technologies Incorporated, located in San Jose, Calif. The companies will offer 3D X-ray imaging as part of a service model which enables customers in the electronics and semiconductor industry to address semiconductor packaging development and failure analysis challenges while evaluating the purchase of their own systems.

As part of the agreement, NanoLab Technologies purchased an Xradia MicroXCT-200, an industry leading platform for 3D X-ray imaging. This new class of X-ray computed tomography scanner features sub-micron pixel resolution and impressive high contrast imaging capabilities for a larger range of sample sizes and shapes. In addition, the Xradia MicroXCT-200 detectors provide superior contrast, even for low absorption materials. The system comes equipped with multiple magnification detectors for easy zoom-in during imaging. 3D X-ray capabilities eliminate the need for physical cross sectioning and delayering for many applications, which reduces analysis time and prevents method induced artifacts.

“The MicroXCT-200 is the ideal solution for semiconductor package and electronic materials imaging”, said John Traub, President, NanoLab Technologies. “Giving our customers the ability to visualize fine embedded structures in 3D within the intact chip package offers insight that’s not possible with typical surface analysis tools like the AFM, SEM or conventional 2D X-ray systems. The Xradia system is a critical addition to our state-of-the-art lab offering


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>



Tektronix introduces Keithley S540 power semiconductor test system
10/19/2016Tektronix, Inc., a worldwide provider of measurement solutions, today introduced the Keithley S540 Power Semiconductor Test System, a ...
Novel Wafer Analyzer for up to 300mm wafer using high speed Raman Imaging Technology
08/08/2016Nanophoton introduces RAMANdrive - a new Wafer Analyzer - for a wide range of applications at semiconductor market a...
Pfeiffer Vacuum introduces HiPace 2800 turbopump for ion implantation applications
07/06/2016Pfeiffer Vacuum has introduced the HiPace 2800 IT turbopump that is designed for ion implantation applications....