July 8, 2009: Carl Zeiss has unveiled a new product in its Sigma line of field emission scanning electron microscopes (FE-SEM).
The “Sigma VP” adds variable pressure technology for exceptional imaging and analysis of non-conductive specimens. Like others in the Sigma line it features Carl Zeiss’ Gemini column. Its chamber includes provision for all WDS variants, and a geometry suitable for coplanar EDS and EBSD analysis. System control is handled by Zeiss’ SmartSEM software. It is compatible with accessories including Zeiss’ BSD and VPSE G3 detectors.
SIGMA VP FE-SEM. (Source: Carl Zeiss)