Zeiss adds variable pressure to Sigma FE-SEMs

July 8, 2009: Carl Zeiss has unveiled a new product in its Sigma line of field emission scanning electron microscopes (FE-SEM).

The “Sigma VP” adds variable pressure technology for exceptional imaging and analysis of non-conductive specimens. Like others in the Sigma line it features Carl Zeiss’ Gemini column. Its chamber includes provision for all WDS variants, and a geometry suitable for coplanar EDS and EBSD analysis. System control is handled by Zeiss’ SmartSEM software. It is compatible with accessories including Zeiss’ BSD and VPSE G3 detectors.


SIGMA VP FE-SEM. (Source: Carl Zeiss)

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

NEW PRODUCTS

VaporSorb filter line protects advanced yield production from Entegris
10/21/2014Entegris, Inc. today announced a new product for its VaporSorb line of airborne molecular contamination (AMC) filters. ...
Next-generation nanoimprint lithography technology
10/21/2014EV Group (EVG) today introduced its SmartNIL large-area nanoimprint lithography (NIL) process....
SEMI-GAS broadens gas mixing capabilities for highly corrosive gases
08/28/2014SEMI-GAS Systems, a provider of ultra-high purity gas delivery equipment, recently broadened the capabilities of its custom Xturion ...