Zeiss touts particle analysis add-on for SEMs

August 17, 2009: Carl Zeiss has introduced a software package that consolidates automatic particle detection, investigation, and characterization capabilities for its scanning electron microscopes (SEM) into one application.

The Smart Particle Investigator (SmartPI) integrates SEM control, image processing, and energy dispersive X-ray (EDX) analysis for particle detection and characterization. A “border particle stitching” algorithm determines the full characteristics and measurements of an individual particle which crosses multiple fields. Images of stitched particles can easily be saved and reviewed. Automation for repetitive sample analysis provides non-subjective results with minimal user involvement; automated calibration and diagnostic procedures ensure results accuracy and system stability. Advanced stop-criteria allows early termination of the analysis if a predefined threshold is reached, reducing analysis time.

Target markets for SmartPI include manufacturing (e.g. cleanliness, quality control), wear analysis and failure prediction (e.g., oil analysis of jet engines), geological survey/mining, forensics, and environmental monitoring.


X-ray analysis and chemical classification of filtered particles from manufacturing cleanliness monitoring in the automotive industry. The major features of the X-ray spectrum indicate that the source of this contamination is derived from a bearing steel. (Source: Carl Zeiss)

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

NEW PRODUCTS

SEMI-GAS broadens gas mixing capabilities for highly corrosive gases
08/28/2014SEMI-GAS Systems, a provider of ultra-high purity gas delivery equipment, recently broadened the capabilities of its custom Xturion ...
Entegris announces GateKeeper GPS platform
07/15/2014Entegris, Inc., announced last week the launch of GateKeeper GPS, its next-generation of automated regeneration gas purification system (GPS) technology....
Bruker introduces Inspire nanoscale chemical mapping system
07/15/2014Bruker today announced the release of Inspire, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial...