(November 3, 2010) — Asylum Research, scanning probe and atomic force microscopy (SPM/AFM) provider, debuted the NanoRack Sample Stretching Stage Accessory for its MFP-3D AFM systems. The stages offer stress control, force measurements, and strain data recording.
This high-strain, high-travel manual stretching stage provides two axis stress control of tensile-loaded samples under different loads. Automatic load cell calibration provides integrated force measurements with MFP-3D images or other measurements, and returns both stress and strain data. Maximum sample load is 80N. Applications for the NanoRack stage include direct measurements to determine interfacial adhesive strength of nano- and micro-scale domains within polymer blends, especially blends generated in-situ in polymerization reactors. Additional applications include measurements of forces required to induce cracking in a variety of biological and inorganic materials.
The stage is compatible with a wide variety of AFM imaging techniques including Phase and Dual AC for enhanced contrast of material properties, as well as the MFP-3D’s Ztherm option for localized thermal analysis.
Dr. Jason Cleveland, Asylum Research CEO, commented, "Currently there are no direct measurement methods for observing nanoscale features and effects under stress control. Our new NanoRack Sample Stretching Stage has already proven extremely useful in industry and academia for measurements of adhesive strength in polymers and stress-induced deformations and cracking in a variety of materials."
Asylum Research provides atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. For additional information, visit www.AsylumResearch.com.