MicroProbe direct-dock extended to ADvantest T2000 SoC test

(December 1, 2010 – Marketwire) — MicroProbe, wafer test technology supplier, is extending its direct-dock offering to support Advantest’s T2000 SoC test platform. The T2000 platform-compatible option — now available on MicroProbe’s complete line of advanced probe cards — enables test coverage at wafer sort. More than 100 direct-dock probe cards are already in the field.

The direct-dock probe card enables final test at wafer sort by removing the bandwidth limitation between the tester and the semiconductor device under test. Using system-level optimization, the direct-dock option shortens the electrical trace length from the tester to the device which results in better signal bandwidth and fidelity. This means earlier detection of certain defects that might otherwise escape wafer test and only become apparent during final test of the packaged devices.

For new product ramps where cost efficiencies and time-to-volume are the new imperatives, or for known-good-die (KGD) test models that require 100% test coverage at wafer sort, the benefits of direct-dock are especially significant.

MicroProbe provides advanced wafer test solutions to global semiconductor manufacturers. For more information about MicroProbe, visit www.microprobe.com.

Subscribe to Solid State Technology/Advanced Packaging.

Follow Advanced Packaging on Twitter.com by clicking www.twitter.com/advpackaging. Or join our Facebook group

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>

LIVE NEWS FEED

NEW PRODUCTS

Pfeiffer Vacuum introduces HiPace 2800 turbopump for ion implantation applications
07/06/2016Pfeiffer Vacuum has introduced the HiPace 2800 IT turbopump that is designed for ion implantation applications....
NanoFocus AG introduces new inspection system for semiconductors industry
05/31/2016NanoFocus AG, the developer and manufacturer of optical 3D surface measuring technology, introduces the new measuring system µ...
Edwards launches new vacuum pumps at SEMICON China 2016
03/15/2016Edwards announced the availability of two new vacuum pump product families at SEMICON China: the iXM Series for semiconductor etch and chemical v...