(December 1, 2010 – Marketwire) — MicroProbe, wafer test technology supplier, is extending its direct-dock offering to support Advantest’s T2000 SoC test platform. The T2000 platform-compatible option — now available on MicroProbe’s complete line of advanced probe cards — enables test coverage at wafer sort. More than 100 direct-dock probe cards are already in the field.
The direct-dock probe card enables final test at wafer sort by removing the bandwidth limitation between the tester and the semiconductor device under test. Using system-level optimization, the direct-dock option shortens the electrical trace length from the tester to the device which results in better signal bandwidth and fidelity. This means earlier detection of certain defects that might otherwise escape wafer test and only become apparent during final test of the packaged devices.
For new product ramps where cost efficiencies and time-to-volume are the new imperatives, or for known-good-die (KGD) test models that require 100% test coverage at wafer sort, the benefits of direct-dock are especially significant.
MicroProbe provides advanced wafer test solutions to global semiconductor manufacturers. For more information about MicroProbe, visit www.microprobe.com.