Multitest wins InCarrier test handling system order

February 24, 2011 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors, received its fifth full purchase order for its InCarrier device transfer system with InStrip test handling system adapted to metal frame-based carriers.

This new test handling process differs from traditional tube or tray loading of devices into gravity feed and pick-and-place systems. Instead, singulated devices are loaded into a patented micro-spring carrier frame that is handled on Multitest’s strip handling system.

With the InCarrier device transfer system, Multitest can achieve high test parallelism for singulated devices without compromising quality through post test singulation processing. The actual test handling is practically jam free, even for devices as small as QFN 2 x 2mm.

Multitest manufactures test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. For more information about Multitest’s InCarrier, visit

Subscribe to Solid State Technology/Advanced Packaging.

Follow Advanced Packaging on by clicking Or join our Facebook group


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>



Edwards launches new Smart Thermal Management System at SEMICON Europa 2016
10/25/2016Smart TMS helps semiconductor, flat panel display and solar manufacturers improve their process performance and safety by red...
Tektronix introduces Keithley S540 power semiconductor test system
10/19/2016Tektronix, Inc., a worldwide provider of measurement solutions, today introduced the Keithley S540 Power Semiconductor Test System, a ...
Novel Wafer Analyzer for up to 300mm wafer using high speed Raman Imaging Technology
08/08/2016Nanophoton introduces RAMANdrive - a new Wafer Analyzer - for a wide range of applications at semiconductor market a...