300-450mm manual wafer test probe configuration out from SemiProbe

June 22, 2011 — SemiProbe released a 300mm manual test probe configuration of its Probe System for Life, M-12. The M-12 is field-upgradable to 450mm and to semi-automatic operation.

The wafer probe tool includes coarse and fine stage movement, allowing precise alignment with vibration isolation. Precision Z and theta mechanisms accomodate large pin count probe cards. Load stroke brings wafers out of the prober. The system has a 360 degree platen with removable front. Contact/separation platen movement is adjustable. SemiProbe Rapid Release allows the operator to move quickly and ergonomically across the wafer without repetitive motion. A cold chamber is available.

SemiProbe offers a wafer map system for manual probers — optical encoders on the stage communicate with a SemiProbe PILOT software wafer map to indicate the current die position the stage is in for testing. Engineers can record test results to the wafer map for export data to other systems downstream. 

The Probe System for Life (PS4L) universal test platform provides a perpetual upgrade path; users can change stages or add components to allow the system to meet unique or different test requirements.

SemiProbe is a global supplier of probing and testing solutions for microelectronics, MEMS, nanotechnology, chemistry, microfluidics, optoelectronics, photovoltaics and more. Learn more at http://www.semiprobe.com/index.php

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