CSCD commissions curve tracers for on-wafer power device test

June 17, 2011 — Cascade Microtech Inc. (NASDAQ:CSCD) engaged Iwatsu Test Instruments Corporation to exclusively manufacture CT-3100/3200 Curve Tracers, which will provide wafer-level measurement for the growing power device market. The curve tracer units complement CSCD’s Tesla probe systems’ high-voltage and high-current capabilities.

The CT-3100/3200 Curve Tracers measure different types of high-power semiconductor devices such as SiC, GaN and/or IGBTs, super-junction MOSFETs, diodes and thyristors. A built-in USB port and LAN interface enable remote control. Complementary to existing SMU-based instruments, the CT-3100/3200 Curve Tracers provide characterization up to 3,000V, 400A, 4,000W peak power and support a leakage mode with cursor resolution of 1pA.

Cascade Microtech suggests power device testers use the curver tracers in combination with its Tesla probe system, which is says will shorten design cycles from traditional package-level device characterization methods that require custom fixtures. On-wafer characterization methods allow device test before dicing and backend packaging steps, which establishes known good die (KGD).

The market for power transistors will continue to post healthy gains through 2014, according to IC Insights. New power semiconductors are constantly in development to meet new energy standards and power consumption/conservation requirements. Power device characterization requires measuring performance across an entire operating region, often at hundreds of amperes and thousands of volts.

Iwatsu Test Instruments Corp. (ITIC) manufactures test equipment, including oscilloscopes.

Cascade Microtech Inc. (NASDAQ:CSCD) provides electrical and mechanical measurement and test tools for integrated circuits (ICs) and other small structures. For more information, visit 

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