SEMICON West 2011, Day 1: SOI vs. FinFET, ReRAM vs. 3D NAND, and lots of video data

by Olov Karlsson, senior director of logic technology, Intermolecular

July 12, 1011 - Greetings from SEMICON West 2011, which opened Tuesday under typically San Franciscan conditions of alternating clouds and sun and cool temperatures. The show floor is satisfyingly energetic; nothing like the huge crowds of a decade ago, but definitely more active than last year


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>


Spectral reflectometer for film thickness measurement
04/08/2014Verity Instruments, Inc. is pleased to announce the availability of its new SP2100 Spectral Reflectometer designed for film thickness measurement f...
New Kimtech Pure G3 EvT nitrile gloves
04/03/2014Kimberly-Clark Professional has introduced a new glove that is designed to provide process protection for the semiconductor and electronics industries....
UVOTECH releases UV-Ozone Cleaning System
04/03/2014Using a UV-Ozone Cleaner, near atomically clean surfaces can be achieved in minutes without any damage to your devices. ...