Metrology project launches in Europe for thin films

March 2, 2012 — The National Physical Laboratory in the UK is leading a new EMRP project on thin film manufacturing metrology for industries such as opto electronics, plastic and printed electronics, displays and lighting, memories and solar cells.

NPL is joined by National Measurement Institutes from across Europe, and other partners. It is a pan-European initiative.

The project aims to create validated and traceable metrology technologies for thin film materials properties, composition, and structure; and for controlling large-area homogeneity and consistency of properties.

The project will develop the necessary metrology to control consistency of thin film processing and improve production quality to reduce costs and time-to-market for new products.

Find out more about the EMRP Thin Films project at http://projects.npl.co.uk/optoelectronic_films/

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