Multitest test contactor suits large-array, high-pin-count digital chip test

March 2, 2012 — Test equipment supplier Multitest launched a new Quad Tech contactor, the Triton contactor, for high-end digital test applications such as server, computer, mobile smartphone, digital TV, and graphics chips.

The Triton contactor is designed for these large-array, highly integrated semiconductor packages with high I/O count and many high-speed differential I/Os. It eliminates contactor bowing, limited compliance and test handler force limitations by offering an enhanced compliance window to accommodate stack height variations, an optimized force to support large BGAs and LGAs and multisite package test. It uses up to 20GHz differential bandwidth.

The Triton was successfully evaluated at high-volume production. Multitest has received several re-orders for the contactors.

Multitest is a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors. For more information about Multitest’s Triton contactors, visit

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