Multitest test contactor suits large-array, high-pin-count digital chip test

March 2, 2012 — Test equipment supplier Multitest launched a new Quad Tech contactor, the Triton contactor, for high-end digital test applications such as server, computer, mobile smartphone, digital TV, and graphics chips.

The Triton contactor is designed for these large-array, highly integrated semiconductor packages with high I/O count and many high-speed differential I/Os. It eliminates contactor bowing, limited compliance and test handler force limitations by offering an enhanced compliance window to accommodate stack height variations, an optimized force to support large BGAs and LGAs and multisite package test. It uses up to 20GHz differential bandwidth.

The Triton was successfully evaluated at high-volume production. Multitest has received several re-orders for the contactors.

Multitest is a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors. For more information about Multitest’s Triton contactors, visit www.multitest.com/Triton.

Subscribe to Solid State Technology/Advanced Packaging

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>

NEW PRODUCTS

SEMI-GAS Xturion Blixer enables on-site blending of forming gas mixtures
10/03/2017The Blixer provides a cost-effective alternative to purchasing expensive pre-mixed gas cylinders by enabling operators to blend ...
Automated thickness measurement system speeds production
09/20/2017ACU-THIK is an automated thickness measurement tool incorporating dual contact probes for high accuracy inspection of semiconductor wafers....
3D-Micromac launches the second generation of its high-performance microcell OTF laser systems
04/17/2017The high-performance production solution for Laser Contact Opening (LCO) of PERC solar cells achieves a th...