New LTXC semiconductor test tools suit ASSP, RF test

March 19, 2012 – GLOBE NEWSWIRE — ATE provider LTX-Credence Corporation (Nasdaq:LTXC) released the Diamondx test platform for application-specific standard products (ASSP) and the DragonRF for radio frequency (RF) devices. In addition, LTX-Credence launched a SerDes test instrument and new testing software.

The Diamondx tool increases tester throughput, offers better multi-site test capability, and has lower capital expenditure and operations costs than comprable tools, according to LTXC. The tool boasts a small footprint with an energy-efficient, air-cooled design. Diamondx is a universal slot architecture that allows for 20-slot, 40-slot and 60-slot configurations. It is compliant with Integrated Multi-System Architecture (IMA) technology, making it upgradeable on the production floor as needed. The tester can accommodate over 5000 pins, and be configured with a range of instruments. Its high-speed data bus is based on PCI-Express-2 industry standard to support high data, high site count and the emergent adaptive test data payload requirements

The Diamondx SerDes instrument Dx-HSIO debuts with the Diamondx platform. It offers 8 lanes of SerDes test capability to 6.4Gbps, enabling lower-cost embedded-clock SerDes lane testing. The Dx-HSIO performs parametric testing of SerDes Tx and Rx ports, aiming for the mobility and consumer ASSP markets.

The Diamondx platform was designed with customer input, and purchase orders are in for testers, said David Tacelli, president and CEO at LTX-Credence. Deployment will soon occur at key outsourced semiconductor assembly and test (OSAT) providers.

LTX-Credence’s next-generation RF tester, DragonRF, targets low cost-of-test for RF devices. Universal RF ports with optional Port to Pin adapter enabling configurations up to 128 RF pins. DragonRF can be configured with 16, or 32 universal vector RF ports per module, with an optional port to pin expander doubling the number of RF ports to 64 pins. The flexible architecture enables price, test coverage, and time balancing. LTXC boasts that the tester’s RF switching technology provides industry-leading settling times. DragonRF provides 6GHz modulated source, 8GHz measure, less than 1ms settling time, and up to 8 receiver paths each with an analog bandwidth exceeding 200MHz for octal site parallel RF measurements. The RF generators are compact to save power and space. DragonRF has been designed to work across multiple test platforms. It will be available in Q2 2012.

The LTXC semiconductor testing software platform Unison features a common graphical test programming environment for Diamond, X-Series, and future product offerings; fast test program development with tools to streamline the validation process of complex system-on-chip and system-in-package devices; a flexible test program structure to serve an entire device family across wafer sort, final test, and different site counts; and the ability to run legacy test programs in the Unison software environment without modification.

Unison is currently available for Diamond test platform and will be available on other test systems later this year.

The Diamondx supports the DragonRF and the Unison test program development environment runs on the Diamondx along with existing Diamond and X-Series test platforms.

LTX-Credence is a global provider of ATE products for wireless, computing, automotive and entertainment market segments. Additional information can be found at www.ltxc.com.

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