May 23, 2012 — Microelectronics standards developer JEDEC Solid State Technology Association created a series of standards, JESD51-5x, for component-level testing of high-brightness/power light-emitting diodes (LEDs). JESD51-5x targets thermal characterization of power LED components and is in compliance with the International Commission on Illumination (CIE)’s existing LED measurement recommendations.
The standards were developed with LED industry leaders in JEDEC’s JC-15 Committee. LED manufacturers and assembly/packaging/test providers will use the new standards.
Efficiency of power LEDs is in the range of 20-40%, and these devices are increasingly used as a lighting source. The design process requires accurate thermal data for LED components. LED lifetime expectancy and light output are dependent on proven thermal design. The JESD51-5x series of standards were developed to give credence to expected lifetime and light output information on LEDs.
JESD51-5x offers clear recommendations for which data to include on LED data sheets, as well as test environments and procedures defined specifically for power LEDs, removing ambiguity about how thermal performance of an LED package or a metal core printed circuit board (MCPCB) assembled LED device is identified.
The new standards will be featured in a presentation at CORM’s (Council for Optical Radiation Measurements) May 31 event in Ottawa, Canada. Dr. Andras Poppe of Mentor Graphics and Budapest University of Technology and Economics, and a key author of the new standards within JC-15, will present “New JEDEC thermal testing standards for high power LEDs.” For more information visit: http://cormusa.org/CORM_2012_Program.html.
JEDEC is a leading developer of standards for the microelectronics industry. JESD51-50, 51, 52 and 53 are all available for free download via the JEDEC website: http://www.jedec.org/standards-documents/results/jesd51-5.