Present at IEEE IEDM 2012

May 22, 2012 — The 58th annual IEEE International Electron Devices Meeting (IEDM) is seeking original presentations on microelectronics research and development. This year’s IEEE IEDM will focus on silicon and non-silicon device and process technology, circuit/device interactions; energy-harvesting, biomedical, and power electronics; magnetics and spintronics; and other topics.

The IEEE IEDM will take place December 10-12 in San Francisco, preceded by 90-minute afternoon tutorial sessions on December 8 and a full day of short courses on December 9. IEDM 2012 will host more than 200 presentations, as well as panel discussions and special events for microelectronics scientists and engineers from industry, academia and government.

Submit an abstract on:

  • Circuit and Device Interaction
  • Characterization, Reliability and Yield
  • Displays, Sensors and MEMS
  • Memory Technology
  • Modeling and Simulation
  • Nano Device Technology
  • Power and Compound Semiconductor Devices
  • Process technology
  • Other topics

The submission deadline is June 25, 2012. Learn more and submit your presentation today at

To register for the event, visit

IEEE, the world’s largest technical professional association, is dedicated to advancing technology for the benefit of humanity. Learn more at

Visit the Semiconductors Channel of Solid State Technology!


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>



Tektronix introduces Keithley S540 power semiconductor test system
10/19/2016Tektronix, Inc., a worldwide provider of measurement solutions, today introduced the Keithley S540 Power Semiconductor Test System, a ...
Novel Wafer Analyzer for up to 300mm wafer using high speed Raman Imaging Technology
08/08/2016Nanophoton introduces RAMANdrive - a new Wafer Analyzer - for a wide range of applications at semiconductor market a...
Pfeiffer Vacuum introduces HiPace 2800 turbopump for ion implantation applications
07/06/2016Pfeiffer Vacuum has introduced the HiPace 2800 IT turbopump that is designed for ion implantation applications....