Electron backscatter diffraction arrives at EAG for crystalline material characterization June 24, 2012 – BUSINESS WIRE — Laboratory network Evans Analytical Group Inc. (EAG) added electron backscatter diffraction (EBSD) to its analytical and testing services. EBSD characterizes the grain structure of crystalline materials, using a scanning electron microscope (SEM) beam to scan a sample and collect diffraction patterns from every point in the SEM image. Users gain information on grain size (histograms and averages), grain shape, grain orientation (texture), deformation, and phase distribution. EAG’s capabilities for crystalline materials characterization include EBSD, x-ray diffraction (XRD), tunneling electron microscopy (TEM), SEM and bulk compositional analysis by WD-XRF, ICP-MS and GD-MS. Also read: SEM tweak enables crystal study of particles as small as 10nm EAG is an integrated, independent laboratory network. EAG’s Materials Characterization Division provides high-value analytical services focused on surface analysis and materials characterization in support of high-technology industries. The company’s Release to Production Division provides expert engineering service and support from chip tape-out to volume production in support of the electronics industry. Other divisions include EAG Life Sciences and EAG Coatings Solutions. EAG is majority owned by Odyssey Investment Partners, LLC, a private equity firm with more than $2 billion in capital under management. Learn more at www.eaglabs.com. Visit the Semiconductors Channel of Solid State Technology!