Cascade Microtech modular wafer probe system offers 6 measurement packages

July 31, 2012 – Marketwire — Cascade Microtech, Inc. (NASDAQ:CSCD), wafer-level IC test equipment supplier, introduced the modular MPS150 manual probe station with six application-specific packages for high-accuracy RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.

The probe station is designed to be upgraded as needed, with a scalable base platform and system packages.

Also read: Cascade Microtech touts wafer-level test innovators at inaugural Innovation Awards

The 6 pre-configured packages for specific measurement applications target measurement repeatability in a shared lab environment, such as a research lab or university. Multiple users can access the prober, change test set-up, and reset quickly to another set up.

The MPS150 system platform comprises a rigid microscope bridge and solid station frame, and a built-in vibration-isolation design. The design protects contact quality over measurement time. Probe placement and contact repeatability are served by backlash-free X-Y-Z movement of probe positioners, integrated platform planarization, and a contact separation drive with 1

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