Cascade Microtech modular wafer probe system offers 6 measurement packages

July 31, 2012 – Marketwire — Cascade Microtech, Inc. (NASDAQ:CSCD), wafer-level IC test equipment supplier, introduced the modular MPS150 manual probe station with six application-specific packages for high-accuracy RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.

The probe station is designed to be upgraded as needed, with a scalable base platform and system packages.

Also read: Cascade Microtech touts wafer-level test innovators at inaugural Innovation Awards

The 6 pre-configured packages for specific measurement applications target measurement repeatability in a shared lab environment, such as a research lab or university. Multiple users can access the prober, change test set-up, and reset quickly to another set up.

The MPS150 system platform comprises a rigid microscope bridge and solid station frame, and a built-in vibration-isolation design. The design protects contact quality over measurement time. Probe placement and contact repeatability are served by backlash-free X-Y-Z movement of probe positioners, integrated platform planarization, and a contact separation drive with 1

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>

LIVE NEWS FEED

NEW PRODUCTS

3D-Micromac launches the second generation of its high-performance microcell OTF laser systems
04/17/2017The high-performance production solution for Laser Contact Opening (LCO) of PERC solar cells achieves a th...
ULVAC launches NA-1500 dry etching system for 600mm advanced packaging systems
03/24/2017ULVAC, Inc. is pleased to announce the NA-1500 dry etching system for 600mm advanced packaging substrates, providing for u...
Astronics Test Systems announces new PXIe test instruments
01/24/2017Astronics Corporation, through its wholly-owned subsidiary Astronics Test Systems, introduced two new test instruments today. ...