Cascade Microtech touts wafer-level test innovators at inaugural Innovation Awards

July 27, 2012 – Marketwire — Cascade Microtech Inc. (NASDAQ:CSCD), supplier of wafer-level measurement instruments for ICs, held its first Innovation Awards Ceremony to honor inventors, authors and other innovators at the company.

Cascade Microtech promoted its history in the test and measurement industry — the first microwave on-wafer probe, the first GHzF- capable probe card, the first on-wafer power device characterization system, the first integrated 1/f noise measurement system, the first multi-channel configurable quadrant probe capable of automated testing over temperature, and the first production power test system — with honors for

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