EDAX debuts SDD series for faster electron microscopy without lost data

July 31, 2012 — EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, introduced the Octane Series silicon drift detectors (SDD) for its TEAM EDS Analysis Systems on electron microscopes.

Also read: Metrology: EFTEM provides elemental mapping at nanometer resolution

Octane SDD enable high-quality EDS data collection at faster speeds, without detrimental losses in data quality at high count rates.

The Octane Series includes four models — the Pro, Plus, Super, and Ultra — for the specific demands of key microanalysis applications. The series’ advanced spectrometer design and state-of-the-art electronics enable energy resolution down to 121eV, with high efficiency in converting input counts into stored data. Its resolution stability translates into higher-quality data at high input count rates.
Pairing the new SDD technology with EDAX’s TEAM EDS software allows users to take advantage of the Smart Features in TEAM Systems to optimize their analysis time and get the best data possible from their sample. In addition to Smart Quant and EXpert ID, the Smart Pulse Pile-Up Correction feature minimizes concerns typical of high count rate collections and allows maximum use of SDD technology.

“Extraction of high-resolution quantitative analysis is now possible from a map collected at 200,000 counts per second,” comments Mike Coy, technical product manager for microanalysis at EDAX.

EDAX supplies Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets. EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices. Website: www.edax.com.

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