Epson launches high-throughput IC test handler for volume test

July 2, 2012 — Seiko Epson Corporation (TSE: 6724) launched the NX1032XS pick-and-place IC test handler, boasting high throughput for transferring, inspecting, and sorting semiconductors in downstream processes.

The IC test handler transfers finished semiconductors to inspection equipment for electrical, visual and other final performance tests, then sorts them by good/defective or other parameters. It transfers, inspects, and sorts up to 20,000 ICs per hour.

With the ability to transfer 32 semiconductors to inspection equipment at a time, this new model offers twice the capacity of Epson’s previous top model, the NS-8160W. Epson also uses its original Smart Motion Control robot control technology to enable fast movement while maintaining low vibration when transferring semiconductors. In addition, the plate can be heated to enable testing at extreme temperatures of up to 155

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