July 11, 2012 — Solid State Technology and SEMI announced the Best of West Award winner — Jordan Valley Semiconductor — during SEMICON West today. Jordan Valley Semiconductor’s QC-TT defect inspection system garnered the award for its ability to predict breakage in 450mm wafers, which are subject to more handling steps and more thermal stresses due to their larger size.
The award recognizes important product and technology developments in the microelectronics supply chain and is presented to a qualifying exhibitor at SEMICON West, the largest and most influential microelectronics exposition in North America. Best of West finalists were selected based on their financial impact on the industry, engineering or scientific achievement, and/or societal impact.
Jordan Valley Semiconductor’s QC-TT predicts damage on 450mm wafers in the semiconductor manufacturing environment, and can identify slip and other crystalline defects in wafers. These defects can contribute to lower yields.
Best of West is determined by a prestigious panel of judges representing a broad spectrum of the microelectronics industry.
450mm is a major topic at the show, with Intel and ASML announcing an investment relationship to fund 450mm/EUV lithography development, as well as a host of new products. Also read: The elephant has left the room — 450mm is a go!
SEMI is a global industry association serving the nano- and microelectronic manufacturing supply chains. For more information, visit http://www.semi.org.
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