Quartz Imaging Corp., Vancouver, BC, Canada, will be showing its newest FA-LIMS system (failure analysis laboratory information system) at the International Symposium for Testing & Failure Analysis (ISTFA 2012), held in Phoenix, AZ on November 13 and 14.
Quartz’s FA-LIMS is designed specifically for semiconductor failure analysis labs. The new FA-LIMS system utilizes new underlying technology to operate with Windows Server 2012 and supports the latest browsers, including Internet Explorer, Chrome, Firefox, and Safari. This web-based system has an improved security model, making it easier to administer system security. The job management process has been further streamlined from previous versions, while providing more advanced management reports of key performance indicators. The system has improved search capabilities and the use of keywords that can be easily added to job and image data.
The "Image Smart" FA-LIMS is a web-based application that features: detailed job requests from authorized internal and external customers; job approval and priority schemes; assignment of tasks based on the approved request; preliminary and approved reports that are very quick and easy to generate; and lab performance reports for management.