Jury finds Qualcomm guilty of patent infringement

ParkerVision, Inc., a developer and marketer of semiconductor technology solutions for wireless applications, today announced that a jury in the U.S. District Court for the Middle District of Florida found Qualcomm Incorporated guilty of direct and indirect infringement of ParkerVision patents. That same jury also found ParkerVision’s patents valid in light of the alleged prior art references identified by Qualcomm during the course of the trial.

The trial, which commenced on October 7, 2013, is being held in two phases. The first phase, which addressed invalidity and direct and indirect infringement, ended today with the jury finding in ParkerVision’s favor. The second phase of the trial will commence immediately with the same jury, and will determine the scope of damages awarded and whether Qualcomm is also guilty of willful patent infringement. With a finding of willful patent infringement, a judge has the authority to enhance damages awarded by the jury by up to three times.

ParkerVision Chief Executive Officer, Jeffrey Parker, commented, “We are extremely pleased with the jury’s verdict in this case and we look forward to presenting our damages and willfulness arguments over the coming days.”

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

2 thoughts on “Jury finds Qualcomm guilty of patent infringement

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

NEW PRODUCTS

Entegris announces GateKeeper GPS platform
07/15/2014Entegris, Inc., announced last week the launch of GateKeeper GPS, its next-generation of automated regeneration gas purification system (GPS) technology....
Bruker introduces Inspire nanoscale chemical mapping system
07/15/2014Bruker today announced the release of Inspire, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial...
MEMS wafer inspection system from Sonoscan
06/25/2014Sonoscan has announced its AW322 200 fully automated system for ultrasonic inspection of MEMS wafers....