NanoWorld AG introduces ultra-short cantilevers for high-speed atomic force microscopy NanoWorld AG announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to visualize dynamic processes at the single molecule level. After a very successful beta-testing phase, six types of AFM probes for high speed scanning will be commercially available from now on. In order to provide a suitable probe for the complete range of high speed scanning applications, the Ultra-Short Cantilevers series consist of six different types of AFM probes divided in 2 categories. Three types of Ultra-Short Cantilevers with very high resonance frequencies (1.2 MHz – 5 MHz) and high force constants are mainly meant for use in dynamic mode applications in air. All AFM probes of the USC type feature a wear resistant tip made from High Density Carbon/Diamond Like Carbon (HDC/DLC) with a typical tip height of 2.5 µm and a radius of curvature typically < 10 nm. The aspect ratio is typically 5:1 and the tilt compensation is 8°. The cantilevers are coated with gold on both sides but the tip remains uncoated.