NanoWorld AG introduces ultra-short cantilevers for high-speed atomic force microscopy

NanoWorld AG announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM).

High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to visualize dynamic processes at the single molecule level.

After a very successful beta-testing phase, six types of AFM probes for high speed scanning will be commercially available from now on.

In order to provide a suitable probe for the complete range of high speed scanning applications, the Ultra-Short Cantilevers series consist of six different types of AFM probes divided in 2 categories.

Three types of Ultra-Short Cantilevers with very high resonance frequencies (1.2 MHz – 5 MHz) and high force constants are mainly meant for use in dynamic mode applications in air.

All AFM probes of the USC type feature a wear resistant  tip made from High Density Carbon/Diamond Like Carbon (HDC/DLC) with a typical tip height of 2.5 µm and a radius of curvature typically < 10 nm. The aspect ratio is typically 5:1 and the tilt compensation is 8°.

The cantilevers are coated with gold on both sides but the tip remains uncoated.

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One thought on “NanoWorld AG introduces ultra-short cantilevers for high-speed atomic force microscopy

  1. raymond

    High Speed Atomic Force Microscopy is the fast growing technique in Scanning Probe Microscopy field. Good post with detailed description.

    Reply

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