SMIC appoints Hiroshi Ogawa as General Manager of SMIC Japan

Semiconductor Manufacturing International Corporation, China’s largest and most advanced semiconductor foundry, announced today that Hiroshi Ogawa was appointed as General Manager of SMIC Japan Corporation.

Mr. Ogawa received his degree in Commerce from Waseda University and has many years of experience in the semiconductor business. He has engaged in a broad spectrum of international sales and marketing based in Japan, USA, Singapore, and Hong Kong. Mr. Ogawa will be responsible for enhancing SMIC’s foundry business in Japan where many of the most advanced semiconductor technologies and products are developed as well as having large potential for growth.

“We are delighted to appoint Mr. Ogawa as General Manager of SMIC Japan,” said Mike Rekuc, Executive Vice President of SMIC Worldwide Sales and Marketing. “His extensive management and business experience in the semiconductor field will further improve SMIC’s regional operation, marketing strategies, and customer support in Japan. We can expect SMIC will play a more important role in Japan’s semiconductor market.”

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

NEW PRODUCTS

Entegris announces GateKeeper GPS platform
07/15/2014Entegris, Inc., announced last week the launch of GateKeeper GPS, its next-generation of automated regeneration gas purification system (GPS) technology....
Bruker introduces Inspire nanoscale chemical mapping system
07/15/2014Bruker today announced the release of Inspire, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial...
MEMS wafer inspection system from Sonoscan
06/25/2014Sonoscan has announced its AW322 200 fully automated system for ultrasonic inspection of MEMS wafers....