3D NAND Challenges and Opportunities

Date: Date and time TBD

Free to attend

Length: Approximately one hour

Registration coming soon!

Conventional planar flash memory technology is approaching critical scaling limitations that are driving the transition to 3D solutions. 3D NAND is expected to scale in height, from 16-bit-tall strings to string heights of more than 128 bits. Meanwhile NAND makers will find ways of placing these strings closer to each other through more aggressive lithography.

Contact Jenna Johnson for sponsorship opportunities for this event.

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