IEEE International Electron Devices Meeting announces 2016 Call for Papers

The 62nd annual IEEE International Electron Devices Meeting (IEDM), to be held at the San Francisco Union Square Hilton hotel December 3 – 7, 2016, has issued a Call for Papers seeking the world’s best original work in all areas of microelectronics research and development.

The paper submission deadline this year is Wednesday, August 10, 2016. This deadline –– about 1½ months later than has been the norm for the IEDM – reduces the time between paper submissions and publication of the cutting-edge research results for which the conference is known. Also new for 2016 is that authors are asked to submit four-page camera-ready abstracts (instead of three pages), which will be published as-is in the proceedings.

Because of the more abbreviated schedule, only a very limited number of late-news papers will be accepted. Authors are asked to submit late-news abstracts announcing only the most recent and noteworthy developments. The late-news submission deadline is September 12, 2016.

“Because microelectronics technology changes so rapidly, it makes sense to shorten the time between when results are achieved and when they are discussed among the industry’s best and brightest who attend IEDM,” said Dr. Martin Giles, IEDM 2016 Publicity Chair and Intel Fellow and Director of Transistor Technology Variation in Intel’s Technology and Manufacturing Group. “This later submission deadline ensures that the freshest and most up-to-date work can be presented at the conference.”

Overall, the 2016 IEDM is seeking increased participation in the areas of power, wearable/Internet of Things (IoT), ultra-high speed, and quantum computing devices, which will be explored in depth in Special Focus Sessions in each area.

At IEDM each year, the world’s best scientists and engineers in the field of microelectronics from industry, academia and government gather to participate in a technical program of more than 220 presentations, along with special luncheon presentations and a variety of panels, special sessions, Short Courses, IEEE/EDS award presentations and other events spotlighting more leading work in more areas of the field than any other conference.

Papers in the following areas are encouraged:

  • Circuit and Device Interaction
  • Characterization, Reliability and Yield
  • Compound Semiconductor and High-Speed Devices
  • Memory Technology
  • Modeling and Simulation
  • Nano Device Technology
  • Optoelectronics, Displays and Imagers
  • Power Devices
  • Process and Manufacturing Technology
  • Sensors, MEMS and BioMEMS

Further information

For more information, interested persons should visit the IEDM 2016 home page at www.ieee-iedm.org.

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