Topic Index

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Asylum Research acquired by Oxford Instruments

Wed, 12 Dec 2012

Abingdon, England--Oxford Instrumentshas acquired Asylum Research, a maker of scanning probe microscopes (SPM) with subsidiaries in the UK, Germany, and Taiwan. Its products are used by academic and industrial customers across the world for a wide range of materials and bioscience applications.

Three-dimensional atomic force microscopy

Wed, 10 Oct 2013
3D atomic force microscopes can measure critical dimensions, line edge roughness and sidewall roughness in a way that is highly accurate, non-destructive and cost-effective.

New techniques produce cleanest graphene yet

Fri, 11 Nov 2013
Columbia Engineers develop new device architecture for 2D materials, making electrical contact from the 1D edge.

SUNY Nanocollege and Albany Law School partner to create nanotech education program

Tue, 11 Nov 2013
‘Ecosystem for Nanotechnology, Entrepreneurship and Law’ (eNTEL) will provide unmatched student experience as launch pad for development of startup companies and attraction of business investment.

Capturing ultrasharp images of multiple cell components at once

Tue, 2 Feb 2014
A new microscopy method could enable scientists to generate snapshots of dozens of different biomolecules at once in a single human cell, a team from the Wyss Institute of Biologically Inspired Engineering at Harvard University reported Sunday in Nature Methods.

Honeywell releases new RadLo low alpha plating anodes for semiconductor packaging applicatons

Fri, 2 Feb 2014
Honeywell announced today that it has introduced new RadLo low alpha plating anodes based on proprietary technology to help reduce alpha particle radiation that can lead to data errors in semiconductors.

Weaker yen impact on the 2013 material and equipment market size

Thu, 3 Mar 2014
Semiconductor industry revenues reported by the World Semiconductor Trade Statistics (WSTS) reached a record high in 2013 with global revenues totaling over $305 million.

ON Semiconductor to acquire Trusense Imaging, Inc.

Thu, 4 Apr 2014
ON Semiconductor today signed a definitive agreement to acquire Truesense Imaging, Inc., a provider of high-performance image sensor devices addressing a wide range of industrial end-markets including machine vision, surveillance, traffic monitoring, medical and scientific imaging, and photography.

IEEE Photonics Society announces Call For Papers

Thu, 4 Apr 2014
The IEEE Photonics Conference 2014 (IPC-2014) has announced a Call for Papers seeking original technical presentations in lasers, optoelectronics, optical fiber networks and related topics for the industry’s premier fall photonics conference.

Rudolph introduces new acoustic metrology and defect inspection technology

Thu, 9 Sep 2014
Rudolph Technologies has introduced its new SONUS Technology for measuring thick films and film stacks used in copper pillar bumps and for detecting defects, such as voids, in through silicon vias (TSVs).

eBeam Initiative announces education and collaboration focus on reactivating density benefits of Moore's Law

Tue, 2 Feb 2015
The eBeam Initiative, a forum dedicated to the education and promotion of new semiconductor manufacturing approaches based on electron beam (eBeam) technologies, today announced that its top theme for 2015 will be the reactivation of the density benefits of Moore's Law through eBeam technology.

SPIE 2015 Awards honor achievements in light-based technologies

Mon, 3 Mar 2015
The awards recognize outstanding technical accomplishments and meritorious service to the society.

JEOL introduces the JSM-6000PLUS NeoScope

Tue, 10 Oct 2015
JEOL's benchtop SEM makes it possible to bring basic high resolution imaging and analysis features of a full-sized Scanning Electron Microscope into the lab.

Stanford engineers create artificial skin that can send pressure sensation to brain cell

Tue, 10 Oct 2015
Stanford engineers have created a plastic "skin" that can detect how hard it is being pressed and generate an electric signal to deliver this sensory input directly to a living brain cell.

Slideshow: 2015 IEDM Preview

Tue, 10 Oct 2015
An advance look at some of the most newsworthy topics and papers that will be presented at this year's IEEE International Electron Devices Meeting.

New NSF-SRC report on energy efficient computing

Thu, 10 Oct 2015
A report that resulted from a workshop funded by Semiconductor Research Corporation and National Science Foundation outlines key factors limiting progress in computing and novel device and architecture research that can overcome these barriers.

Manipulating wrinkles could lead to graphene semiconductors

Mon, 10 Oct 2015
RIKEN scientists have discovered that wrinkles in graphene can restrict the motion of electrons to one dimension, forming a junction-like structure that changes from zero-gap conductor to semiconductor back to zero-gap conductor.

New Helios G4 Series DualBeam from FEI sets new standards

Tue, 11 Nov 2015
FEI announced the Helios G4 DualBeam series, which offers the highest throughput ultra-thin TEM lamella preparation for leading-edge semiconductor manufacturing and failure analysis applications.

Versatile high throughput SEM from JEOL

Wed, 11 Nov 2015
JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes.