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Asylum Research acquired by Oxford Instruments

Wed, 12 Dec 2012

Abingdon, England--Oxford Instrumentshas acquired Asylum Research, a maker of scanning probe microscopes (SPM) with subsidiaries in the UK, Germany, and Taiwan. Its products are used by academic and industrial customers across the world for a wide range of materials and bioscience applications.

Entropic to close and consolidate several global facilities

Mon, 6 Jun 2014
Entropic announced plans today to close and consolidate several global facilities, a move that would impact approximately 23 percent of Entropic's headcount.

New software update for parametric test system reduces test times by 25 percent

Thu, 9 Sep 2015
Tektronix, Inc. announced the release of a major system software update for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent.

Tektronix expands DPO70000SX ATI high performance oscilloscope family

Mon, 9 Sep 2015
Tektronix, Inc. today announced the expansion of its DPO70000SX Performance Oscilloscope Series to include 50 GHz and 23 GHz models.

Yamaichi Electronics 0.35mm pitch test contactor for semiconductor evaluation

Fri, 10 Oct 2015
Yamaichi Electronics presents Test Contactors for lab and reliability applications and ultra fine pitch semiconductor devices.

FEI announces agreement to acquire DCG Systems

Tue, 11 Nov 2015
FEI Company and DCG Systems, Inc. announced an agreement where FEI willacquire DCG for $160 million in an all cash transaction.

Versatile high throughput SEM from JEOL

Wed, 11 Nov 2015
JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes.

Ultratech introduces superfast 4G+ low-cost in-line inspection system for patterned wafers

Wed, 11 Nov 2015
Ultratech, Inc. today introduced the Superfast 4G+ in-line, 3D topography inspection system.