Upcoming Webcasts

JOIN US FOR OUR PROGRAM OF LIVE AND INTERACTIVE SOLID STATE TECHNOLOGY WEBCASTS

Register today for these upcoming webcasts. The dates and times for some webcasts have not yet been set, please select the webcasts that you would like to pre-register for and complete your information at the bottom of this page and you will be notified via email when the webcast has been scheduled. After the live event each Webcast is archived, and can be viewed on demand.

Solid State Technology is looking for more speakers to present during our upcoming webcasts! Submit your abstract here.

Browse On-Demand Webcasts here


Interconnects


June 2015 (Date and time TBD)

This webcast will examine the state-of-the-art in conductors and dielectrics, -- including contacts and Metal1 through global level -- pre-metal dielectrics, associated planarization, necessary etch, strip and cleans, embedded passives, global and intermediate TSVs for 3D, as well as reliability, system, and performance issues.




Understanding Defects


July 2015 (Date and time TBD)

Yield improvement and production engineers working on today's ICs encounter many challenges as defects affecting device operation go undetected by traditional in-line techniques. Electrical Failure Analysis (EFA) is a suite of techniques that helps the modern day fab increase yields by isolating faults to areas small enough for Physical Failure Analysis (PFA). In this Webinar, we showcase a few of the proven EFA fault isolation techniques and describe how EFA helps to characterize the underlying defects.




Lock-in Thermography for Advanced Assembly Qualification


August 2015 (Date and time TBD)

Increasing IoT business opportunities drive a need for new packaging techniques such as FOWLP, Embedded Component Packaging, etc. Such new assembly techniques allow more components and functionality to be integrated into an ever decreasing package space. In parallel the faster product cycle drives the need for faster production ramp to stay competitive. All these challenges highlight the need for a better methodology to determine root cause of assembly-related defects during the new package process qualification process. We will demonstrate a totally non-destructive fault localization method based on a lock-in thermography with examples in these areas.


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For more information on Solid State Technology's webcast program and sponsorship opportunities, please contact:

Sabrina Straub
Sales Manager
P: 603.770.6569
E: sstraub@extensionmedia.com


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