Stress Test System

The Accelerated Stress Test system can demonstrate in hours how a product will hold up after years of use. The system applies environmental stresses that accelerate product fatigue and expose defects that surface over time under normal conditions. Extreme stresses are imparted to products under test through ultra-high rates of temperature change in excess of 70∞C/min and multi-aces, repetitive shock vibration capable of producing acceleration forces over 50 g.


Holland, Mich.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *


Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...