Infringement suit filed by KLA-Tencor against ADE Corp.

San Jose, California–KLA Tencor Corp. recently filed patent infringement counterclaims against ADE Corp. in U.S. District Court in Delaware. The counterclaims allege that ADE has infringed upon and continues to infringe upon three patents owned by KLA-Tencor. The patents include U.S. Patent No. 5,226,118, entitled “Data Analysis System and Method for Industrial Process Control System,” U.S. Patent No. 5,883,710, entitled “Scanning System for Inspecting Anomalies on Surfaces,” and U.S. Patent No. 6,081,325, entitled “Optical Scanning System for Surface Inspection.”

The suit seeks damages for patent infringement, as well as an injunction against any future infringement activity. In addition, KLA- Tencor has asked the District Court for a declaration that U.S. Patent No. 6,118,525 is invalid and not infringed upon by KLA-Tencor.

ADE had filed suit against KLA-Tencor in October of this year for allegedly infringing that patent.

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...