PEER to adopt SEMI 300mm tests

October 22, 2003 – The PEER Group, Kitchener, Ontario, Canada, plans to add International Sematech’s 300mm equipment integration and automation conformance tests into its automation compliance methodology.

PEER’s services provide supplier guidance and tool testing expertise to IC manufacturers to ensure that new equipment meets fab automation requirements.

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...