SEMI Issues 13 New Technical Standards

(June 24, 2005) San Jose, Calif. &#8212 Included in SEMI’s new July 1, 2005 standards are 13 new specifications and guidelines for ellipsometer equipment for integrated metrology, sensor/actuator network communications, silicon carbide wafers, and safety in multi-employer work areas. The 13 new technical standards apply to the semiconductor, flat panel display (FPD), and MEMS manufacturing industries, and were developed by technical experts from equipment suppliers, device manufacturers, and other companies participating in the SEMI International Standards Program. You may view the complete list here, and the standards are available for purchase in either CD-ROM or downloadable format from SEMI’s website.

(June 27, 2005) Mountain View, Calif. &#8212 Synopsys Inc. and Renesas Technology Corp. have created a 90-nm system-on-chip (SoC) design for wireless applications using Synopsys’ Galaxy design platform. Synopsys’ physical design solution &#8212 with advanced design for yield (DFY) capabilities in the Astro product &#8212 enabled Renesas to meet their yield goals in this production design.

“With this being our 90-nm wireless design, we were concerned about DFM issues,” states Teruaki Harada, DFM and EDA Technology Development department manager, Design Technology Division, Renesas Technology. “The yield-enhancement techniques in Synopsys’ Galaxy design platform, particularly the Astro product’s ability to insert redundant vias and efficiently enforce antenna rules, helped us significantly optimize our design and achieve our 90-nm yield targets.”


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