Characterizing New Materials with Electron Microscopy

The Scanning Electron Microscope (SEM) is one of the most powerful and versatile instruments in materials science. Its electron beam is capable of generating multiple signals, providing high-resolution information about the composition, phase electrical, optical and other properties of a device sample. Applications include electrical analysis, compositional analysis, dynamic experiments, complement image contrast and Focused Ion Beam (FIB) preparation and imaging. This white paper explores the ways you can maximize the performance of your SEM.

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