TEM Sample Prep

Sample preparation for TEM requires levels of accuracy in a range of specs, but none are more critical than thickness. While manual methods may work for non-specific locations, focused ion beam (FIB) methods can yield the high-accuracy placement required at a faster pace. This white paper offers tips for preparing that thin sample you’re shooting for, and it includes an example of successful lamella prep with timing details to give you a good idea of what you can achieve.

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