Explore Further with Magellan

The MagellanTM 400 family, the world’s first Extreme High Resolution (XHR) SEMs, deliver sub-nanometer, surface-sensitive imaging without sacrificing the analytical capabilities, sample flexibility or ease-of-use that SEMs offer. As a result, it extends SEM versatility to new applications: see high-contrast and never-before-seen surface detail on complex structures at sub-nm resolution, without compromising high throughput and usability. Download the whitepaper to read more.

Size: 0.00


KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...