World-class metrology precision is now available at about half the cost of traditional CD SEM systems for data storage manufacturing. The PTM 600TM CD SEM Improves the precision of pole measurement while providing more cost-effective row bar measurement. With its automated, gauge-capable, full-image SEM metrology, the PTM 600 is production-ready for today’s advanced technology as well as tomorrow’s data-storage process development. Download the whitepaper to read more.

Size: 0.00


Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...