TEM: Atom-Probe Microscopy LEAPs the Chasm to Mainstream Applications

Atom-probe microscopy has crossed the chasm to mainstream research and industrial applications, transforming itself from a laboratory curiosity to an essential capability in world- class microscopy centers. While it offers a resolution comparable to Transmission Electron Microscopy (TEM), fundamental differences in the imaging and analysis mechanisms yield unique and often complementary capabilities. This article demonstrates that, by combining atom probe and TEM analysis, one technique is able to elucidate details of structure and composition that cannot be resolved by the other.



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