C-V/I-V Testing Becomes Faster, Simplier, and More Economical

In the semiconductor industry, the need for increased test efficiency and productivity has never been greater. Rapidly changing technology is creating the need for more complex and faster testing to increase product reliability and get products to market more quickly. Keithley is filling this need with its new C-V test system, the first of its kind to enable tightly integrated C-V/I-V/pulse testing in a compact, benchtop design that enables users of all experience levels to make expert measurements. At the same time, its price and capabilities are lowering ownership costs for the semiconductor fabs and labs that use this equipment.



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