Multitest test contactor wins out in IDM yield comparison

August 18, 2011 — An IDM recently performed side-by-side comparisons of a Multitest Mercury test contactor and an "established contactor of an incumbent Asian competitor" during high-volume production package testing.

The Multitest Mercury contactor improved the IDM’s first pass yield (FPY) in semiconductor test on average by two to six percentage points. The IDM will deploy the Mercury for this testing application on multiple set ups.

Mercury uses flat probe technology for cost-effective test, a barrel-less probe design with dual fork redundant bias, and is qualified at several top 20 IDMs and fabless semiconductor companies. It offers typical test contactor probe life of 500k to 700k insertions (More than 1.5m insertions in wafer-level applications).

Multitest manufactures test equipment for semiconductors, including test handlers, contactors, and ATE printed circuit boards. The Mercury  is a product of Multitest’s Contactors Division. For more information, visit

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