Multitest position detection system prevents jams in test handlers

September 1, 2011 — Test system maker Multitest reports improved tested-device placement with MT2168 at a high-volume semiconductor production site in Asia. The customer experienced a significant improvement in the placement rate of tested devices in the output tray.

The MT2168’s position detection and control (PDC) prevents misplacement into trays and plates due to mechanical tolerances or thermal expansions, including with small packages and tray variations.

The PDC concept on the MT2168 uses sensor-based alignment in the standard pick-and-place processes. The MT2168


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