MEMS panel, tablet teardown, smart grid talk highlights of upcoming Sensors in Design

January 19, 2012 — Sensors in Design 2012 takes place March 28-29 in San Jose, CA. With speakers from Texas Instruments and Intel, InvenSense, Analog Devices, and more, the event is designed for attendees to better understand sensor technologies and their applications.

Highlights of the 2012 event include a tablet PC teardown, with accompanying mobile-device sensor discussion; a panel on micro electro mechanical system (MEMS) future design trends and applications; and sessions on sensor integraion for smart grids and wireless cloud sensor networks.

Confirmed speakers include:
Steve Nasiri, Founder, President & CEO, InvenSense
Stephen Whalley, Director, Sensors, Intel
Steven Arms, President & CEO, Microstrain
Jamshid Avloni, President & CEO, Eeonyx
Brian Maccleery, Principal Product Manager for Clean Air Technology, National Instruments
Jamie Wiczer, Founder & President, Sensor Synergy
Thurston Brooks, VP Product Marketing. 3eTi
Mark Buccini. Director, Texas Instruments
Bob Scanell, Business Development Manager, Analog Devices, Inc.

View full sessions and register at www.sensorsindesign.com.

View recent issues of the MEMS Direct newsletter

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

Introducing Semiconductor Digest
04/30/2019Semiconductor Digest is a new magazine dedicated to the worldwide semiconductor industry...
KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...