Spectroradiometer measures LED phosphors

February 29, 2012 — Gamma Scientific developed the Bi-Spectral Fluorescence Spectroradiometer to quickly obtain detailed fluorescence data for light-emitting diode (LED) phosphors and other fluorescent or reflective materials.

The tester measures the transmitted and reflected spectrum of materials when illuminated by monochromatic light, via a pair of Gamma Scientific RadOMA spectroradiometers. It obtains spectral reflectance, spectral transmittance and absorption data simultaneously while utilizing dual, calibrated integrating spheres to measure total flux.

The tool incorporates 2 Gamma Scientific RadOMA Spectroradiometers, 2 Gamma Scientific Integrating Spheres mounted on a rail system, a Gamma Scientific FlexOptometer power meter, Xenon light source and Monochromator, optical mixing rod and lens tube, and a sample holder placed between the two integrating spheres. A single sphere configuration is also available.

Also read: Gamma Scientific uncrates low-cost LED tester

The Bi-Spectral Spectroradiometer’s fluorescence data can be used to tailor LED phosphor compositions for maximium performance and lower manufacturing costs. It calculates which phosphor samples have the highest transmission, reflection and absorption, and determines the exact wavelengths that fluoresce most intensely, as well as the spectrum of fluorescing light at any excitation wavelength.

Absorption, reflection and transmission data are graphed in 3D for visualization of where the samples fluoresce, with user ability view, analyze and compare samples. Data can be exported to Excel and other data analysis programs.

Gamma Scientific makes tools for precision light measurements. LED testing products include spectroradiometers, integrating spheres, turn-key LED test systems, high-speed LED sorters, photometers and radiometers. Gamma Scientific also operates a NVLAP accredited laboratory for LM-79 testing. Learn more at www.gamma-sci.com.

Visit the new LEDs Manufacturing Channel on ElectroIQ.com!

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...