Theta Delta’s burn-in & long-term semiconductor testers gain Core Wafer Systems technologies

February 8, 2012 – PRNewswire — Theta Delta (TD) will incorporate Core Wafer Systems Inc. (CWS) technologies into its burn-in test and long-term reliability test systems for semiconductors. Core Wafer Systems provides parallel measurement schema for semiconductor test.

This alliance covers an install base of over 350 system testers, including customers such as Raytheon and Triquint.

The exclusive agreement allows Core Wafer to market, sell, and deliver improvements to TD’s burn-in and long term reliability system testers. Improvements for building functionality into CWS software and creating advanced reliability test libraries for long stress times for specific use cases are identified. Core Wafer will retool the tester to use their proprietary source measure units (SMU) and reliability algorithm test library, PDQ-WLR 7, for better performance. The goal is faster and lower-cost wafer test, allowing the correlation in test variables as users move from accelerated times to long-duration stress times.

Also read: CWS upgrades on-wafer accelerated reliability line for Agilent testers

The alliance with TD joins Core Wafer’s semiconductor and nanotechnology business and magnetics test systems unit as a third revenue stream.

"This alliance positions Core Wafer Systems as the only company that can address semiconductor manufacturers’ needs from accelerated to long-term testing and burn-in which allows direct data correlation from on-wafer to package devices," said Greg Miller, member of the Board of Directors at APII and marketing director at CWS, adding that the partnership has already led to contractual conversations with a Taiwanese manufacturer with an estimated value of over $800,000 in the second half of 2012. Core Wafer expects to pull in $6 million+ over the next 24 months thanks to the TD alliance.

Action Products International, Inc. (OTC Pink:APII.PK) is the parent company of Core Wafer Systems, Inc., which provides parallel measurement schema for evaluation of physical phenomena in semiconductor and magnetic devices and processes. Learn more at or

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