Metrology project launches in Europe for thin films

March 2, 2012 — The National Physical Laboratory in the UK is leading a new EMRP project on thin film manufacturing metrology for industries such as opto electronics, plastic and printed electronics, displays and lighting, memories and solar cells.

NPL is joined by National Measurement Institutes from across Europe, and other partners. It is a pan-European initiative.

The project aims to create validated and traceable metrology technologies for thin film materials properties, composition, and structure; and for controlling large-area homogeneity and consistency of properties.

The project will develop the necessary metrology to control consistency of thin film processing and improve production quality to reduce costs and time-to-market for new products.

Find out more about the EMRP Thin Films project at http://projects.npl.co.uk/optoelectronic_films/

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...