Semiconductor packaging house orders 14 Rudolph Technologies inspection tools

May 29, 2012 — Rudolph Technologies Inc. (NASDAQ: RTEC), back-end macro defect inspection tool supplier, will deliver 14 NSX Series 320 inspection systems to a large outsourced semiconductor assembly and test (OSAT) provider.

The inspection tools will be installed in Q2, at multiple steps in wafer-level chip-scale packaging (WLCSP) production.

The packaging house chose to order NSX 320 systems following a competitive evaluation, in which they noted its high speed and efficient, easy-to-use operating procedures.

This is a new product for Rudolph. The NSX320 System performs defect inspection and 2D bump metrology, and acquires on-the-fly defect images at production speeds. WLCSP lines require flexibility for handling substrates in various formats while collecting detailed defect and 2D metrology information during the inspection process, said Nathan Little, vice president and general manager of Rudolph

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...