Present on semiconductor metrology and more at ASMC 2013

August 22, 2012 — ASMC, the leading international technical conference for exploring solutions to improve collective microelectronics manufacturing expertise, has issued a call for papers for next year’s event, being held May 14-16 in Saratoga Springs, NY. The abstract deadline is October 24, 2012. ASMC 2013 is now accepting abstracts in 16 topic areas:

  • Packaging and through-silicon via (3D/TSV)
  • Advanced equipment processes and materials (AEPM)
  • Advanced metrology (AM)
  • Advanced patterning / Design for manufacturability (AP/DFM)
  • Advanced process control (APC)
  • Contamination free manufacturing (CFM)
  • Defect inspection and reduction (DI)
  • Data management and data mining tools (DM)
  • Equipment reliability and productivity enhancements (ER)
  • Enabling technologies and innovative devices (ET/ ID)
  • Factory automation (FA)
  • Green factory (GF)
  • Industrial engineering (IE)
  • Lean manufacturing (LM)
  • Yield enhancement/learning (YE)
  • Yield methodologies (YM)

All papers will be considered for the Entegris Best Paper Award, and student-authored papers are eligible for consideration as the GlobalFoundries Outstanding Student Paper. Select papers also will be featured in the IEEE Transactions on Semiconductor Manufacturing.

Learn more about being a speaker at ASMC here: http://www.semi.org/en/node/38316.

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.

Leave a Reply

Your email address will not be published. Required fields are marked *

NEW PRODUCTS

KLA-Tencor announces new defect inspection systems
07/12/2018KLA-Tencor Corporation announced two new defect inspection products at SEMICON West this week, addressing two key challenges in tool and process monit...
3D-Micromac unveils laser-based high-volume sample preparation solution for semiconductor failure analysis
07/09/2018microPREP 2.0 provides order of magnitude time and cost savings compared to traditional sample...
Leak check semiconductor process chambers quickly and reliably
02/08/2018INFICON,a manufacturer of leak test equipment, introduced the UL3000 Fab leak detector for semiconductor manufacturing maintenance teams t...